Adaptive Monitoring and Diagnosis of Service Status of High-end Equipment

Deadline for manuscript submissions: December 31 2025

 

Special Issue Editors

Dr. Haiyang Pan  Website  E-Mail: pansea@ahut.edu.cn
Anhui University of Technology, China
Interests: fault diagnosis; pattern recognition; intelligent diagnosis

 

 

 

Dr. Jian Cheng  Website  E-Mail: chengjian@ahut.edu.cn
Anhui University of Technology, China
Interests: signal processing; fault diagnosis

 

 

 

Dr. Xin Li  Website  E-Mail: li_xin@cumt.edu.cn
China University of Mining and Technology, China
Interests: signal processing; fault diagnosis

 

 

Special Issue Information

Dear colleagues,

 

With the progress of science and technology, high-end equipment is widely used and its structure becomes more and more complex. The failure of its parts is related to the service state of the whole machine. In this case, the key role of condition monitoring and fault diagnosis technology cannot be overemphasized, because they play an important role in realizing the sustainable and flexible development of high-end equipment. Condition monitoring and fault diagnosis mainly use the acceleration, temperature, sound and other information provided by sensors to realize remote, real-time and online monitoring through communication technology. Although it is expected to be implemented in real life, they are also facing open challenges, mainly because the fault characteristics of collected data are weak due to the strong coupling of multiple excitation sources.

This Special Issue is devoted to discussing the advanced condition monitoring and fault diagnosis technology of high-end equipment, especially related to adaptive decomposition, noise reduction and feature extraction, so as to promote the development of condition monitoring and fault diagnosis technology of high-end equipment and ensure the healthy and efficient operation of high-end equipment.

We welcome all kinds of articles, such as theoretical and empirical articles, comparative verification and analysis, for submission to this Special Issue. We will accept manuscripts from different disciplines and discuss topics related to the scope.

 

Dr. Haiyang Pan

Dr. Jian Cheng

Dr. Xin Li

Guest Editors

 

Keywords

fault diagnosis
signal processing
feature extraction
condition monitoring
adaptive decomposition
feature enhancement
noise reduction

 

Published Papers